2001 June

Computer Automated Test System for LDMOS Wireless RF Power Amplifiers

Computer Automated Test System for LDMOS Wireless RF Power Amplifiers

• We provided an automated RF Test System to provide computer automated testing of LDMOS RF Power Amplifiers. The amplifiers are used in base stations for AMPS, PCS, UMTS systems. Software was developed using National Instruments LabVIEW
• RF Measurements provided at several Output Power Levels
  • Gain
  • Gain Compression (servoed to X dB gain compression)
  • Output Power (servoed to a specified power)
  • Intermodulation Products (IMD)
  • Adjacent Channel Power (ACP)
  • Return Loss
• DC Measurements included:
  • IDQ Servo (Adjust Vgg to achieve desired Idd current)
  • Idd measurement at RF Output Power
  • Ronq
  • Ronh
  • Gmq
  • Gmh
• Other Measurements
  • Efficiency
  • Power Added Efficiency (PAE)
• For an overview presentation of the LDMOS Automated Test System:
  • 3.8 MB pdf file, good for printing
  • 1 MB pdf file, good for screen viewing